Combining High-Resolution TEM on Graphene With In-Situ Hall Measurements 105 Combining High-Resolution TEM on Graphene With In-Situ Hall Measurements

We describe an approach allowing high-resolution transmission electron microscopy (HRTEM) on specimens like graphene and the investigation on their electronic transport properties at the same time. The experimental set-up presented here is based on the modification of a commercial TEM specimen holder and on a specially designed sample carrier. A customized Hall sensor confirms that the local magnetic field provided by the microscope’s objective lens is sufficiently high and homogenous for in-situ Hall effect measurements. Finally, we discuss first experimental results on defective graphene specimens. Indeed, our data reveals great potential in terms of correlating the information which we gain from HRTEM images with the corresponding transport properties, but also indicates further tasks and challenges.